Abstract:

Testing-effort (TE) and imperfect debugging (ID) in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models (SRGMs). For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions (TEFs), i.e., delayed S-shaped TEF (DS-TEF) and inflected S-shaped TEF (IS-TEF), are proposed. Then these two TEFs are incorporated into various types (exponential-type, delayed S-shaped and inflected S-shaped) of non-homogeneous Poisson process (NHPP) SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs. The experimental results show that: (i) the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs; (ii) incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs; (iii) the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.

Key words: testing-effort (TE), imperfect debugging (ID), software reliability growth models (SRGMs), S-shaped, non-homogeneous Poisson process (NHPP)