TY - Journal of Systems Engineering and Electronics A1 - Fengfei WANG, Shengjin TANG, Xiaoyan SUN, Liang LI, Chuanqiang YU, Xiaosheng SI T1 - Remaining useful life prediction based on nonlinear random coefficient regression model with fusing failure time data Y1 - 2023-03-03 JF - Journal of Systems Engineering and Electronics JO - Journal of Systems Engineering and Electronics SP - 247 EP - 258 VL - 34 IS - 1 UR - https://www.jseepub.com N1 - 10.23919/JSEE.2023.000006 ER -