×
模态框（Modal）标题
在这里添加一些文本
Close
Close
Submit
Cancel
Confirm
×
模态框（Modal）标题
在这里添加一些文本
Close
×
Home
About JSEE
Guide for Authors
View Articles
Early Access
Contact us
JSEE@IEEE
Aims and Scopus
Abstracting/Indexing
Editorial Board
Open Access
Before You Begin
Preparation
Template
Download
Latest Issue
Archive By Column
All Issues
Most Read Articles
Most Download Articles
Fully Bayesian reliability assessment of multi-state systems with overlapping data
Zhipeng Hao, Jianbin Guo, and Shengkui Zeng
Systems Engineering and Electronics . 2017, (
1
): 187 . DOI: 10.21629/JSEE.2017.01.21
