1. Department of Automation, The Second Artillery Engineering University, Xi’an 710025, China;
2. Department of Automation, Tsinghua University, Beijing 100084, China;
3. Guangdong University of Petrochemical Technology, Maoming 525000, China
Zhiliang Fan1, Guangbin Liu1, Xiaosheng Si1,2,*, Qi Zhang1, and Qinghua Zhang3. Degradation data-driven approach for remaining useful life estimation[J]. Journal of Systems Engineering and Electronics, 2013, 24(1): 173-182.