Journal of Systems Engineering and Electronics

• RELIABILITY • Previous Articles     Next Articles

Reliability analysis of extended generalized inverted exponential distribution with applications

Arwa M. Alshangiti, M. Kayid * , and M. Almulhim   

  1. Department of Statistics and Operations Research, College of Science, King Saud University, Riyadh 11451, Saudi Arabia
  • Online:2016-04-25 Published:2010-01-03


A general version of the inverted exponential distribution is introduced, studied and analyzed. This generalization depends on the method of Marshall-Olkin to extend a family of distributions. Some statistical and reliability properties of this family are studied. In addition, numerical estimation of the maximum likelihood estimate (MLE) parameters are discussed in details. As an application, some real data sets are analyzed and it is observed that the presented family provides a better fit than some other known distributions.