Systems Engineering and Electronics
• DEFENCE ELECTRONICS TECHNOLOGY •
Xianghui Yuan and Tao Liu*
A novel estimation of the equivalent number of looks (ENL) is proposed in statistical modeling of multilook polarimetric synthetic aperture radar (PolSAR) images for the product model, which is based on the log-determinant moments (LDM). The LDM estimators discovered by looking at certain log-cumulants of the intensities of different polarization channels and the multilook polarimetric covariance matrix, which can be used for both the Gaussian model and all product models. This estimator has analytic expressions, and uses the full covariance matrix and intensities as input, which makes more statistical information available. Experiments based on simulated data and real data are performed. The comparisons among the widely used methods of equivalent number of looks (ENL) estimation for the product model such as K and G0 distributions show that the performance of the LDM estimator is outstanding. The performance of estimators for the real data of San Francisco and Flevoland is analyzed and the results are according to those of simulated data. Finally, it can be concluded that the LDM estimator is well robust to each product model with low computational complexity and high accuracy.
Xianghui Yuan and Tao Liu. Texture invariant estimation of equivalent number of looks based on log-cumulants in polarimetric radar imagery[J]. Systems Engineering and Electronics, doi: 10.21629/JSEE.2017.01.08.
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