Journal of Systems Engineering and Electronics ›› 2010, Vol. 21 ›› Issue (3): 461-468.doi: 10.3969/j.issn.1004-4132.2010.03.017

• MILITARY SYSTEMS ANALYSIS • Previous Articles     Next Articles

Ultrafast optoelectronic technology for radio metrology applications

Zhe Ma1,2,*, Hongmei Ma1, Pengwei Gong1, Chuntao Yang1,2, and Keming Feng1,2   

  1. 1. Beijing Institute of Radio Metrology and Measurement, Beijing 100854, P. R. China;
    2. National Key Lab of Metrology and Calibration Technology, Beijing 100854, P. R. China
  • Online:2010-06-23 Published:2010-01-03

Abstract:

Ultrafast optoelectronic technology has been widely used in terahertz time domain spectrum, terahertz imaging technology, terahertz communication and so on, and great progress has been achieved in the past two decade. Recently, this innovative technology has been applied in radio metrology and supplied a potential and hopeful method to solve the existent challenges of calibration devices and equipments with bandwidth up to 100 GHz. This paper generally summarizes the emerging applications of the ultrafast optoelectronic technology in radio metrology. The main applications of this technology in calibrating broadband sampling oscilloscopes, the high-speed photodiodes and calibrating the electrical pulse generators are emphasized, and the testing of monolithic microwave integrated circuits is also presented.