Journal of Systems Engineering and Electronics ›› 2010, Vol. 21 ›› Issue (4): 572-579.doi: 10.3969/j.issn.1004-4132.2010.04.008
• DEFENCE ELECTRONICS TECHNOLOGY • Previous Articles Next Articles
Leilei Kou1,2,*, Xiaoqing Wang1, Jinsong Chong1, Maosheng Xiang1, and Minhui Zhu1
1. National Key Laboratory of Microwave Imaging Technology, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P. R. China;
2. Graduate University of Chinese Academy of Sciences, Beijing 100049, P. R. China