Journal of Systems Engineering and Electronics ›› 2007, Vol. 18 ›› Issue (2): 434-436.
• SOFTWARE ALGORITHM AND SIMULATION • Previous Articles
Yuan Haiying, Chen Guangju & Xie Yongle
Online:
Published:
Abstract:
Choosing the right characteristic parameter is the key to fault diagnosis in analog circuit. The feature evaluation and extraction methods based on neural network are presented. Parameter evaluation of circuit features is realized by training results from neural network; the superior nonlinear mapping capability is competent for extracting fault features which are normalized and compressed subsequently. The complex classification problem on fault pattern recognition in analog circuit is transferred into feature processing stage by feature extraction based on neural network effectively, which improves the diagnosis efficiency. A fault diagnosis illustration validated this method.
Yuan Haiying, Chen Guangju & Xie Yongle. Feature evaluation and extraction based on neural network in analog circuit fault diagnosis[J]. Journal of Systems Engineering and Electronics, 2007, 18(2): 434-436.
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https://www.jseepub.com/EN/Y2007/V18/I2/434