Random testing for system-level functional verification of system-on-chip?
Ma Qinsheng1, Cao Yang1,2, Yang Jun1 & Wang Min3
1. School of Electronic Information, Wuhan Univ., Wuhan 430079, P. R. China; 2. State Key Lab. of Software Engineering, Wuhan Univ., Wuhan 430072, P. R. China; 3. Second Dept., Commanding Communications Academy, Wuhan 430010, P. R. China
Ma Qinsheng1, Cao Yang1,2, Yang Jun1 & Wang Min3. Random testing for system-level functional verification of system-on-chip?[J]. Journal of Systems Engineering and Electronics, 2009, 20(6): 1378-1383.