Five modified boundary scan adaptive test generation algorithms
Niu Chunping, Ren Zheping & Yao Zongzhong
Journal of Systems Engineering and Electronics . 2006, (4): 760 -763 .  DOI: 10.1016/S1004-4132(07)60012-7

京ICP备11035014号-5
Copyright © Editorial Office of Journal of Systems Engineering and Electronics, Beijing Institute of Aerospace Information
TEL: 86-10-68388406/68386014    E-mail：xtgcydzjs@126.com(系统工程与电子技术)/jseeoffice@126.com(JSEE)
Support by Beijing Magtech Co.ltd.