Journal of Systems Engineering and Electronics ›› 2006, Vol. 17 ›› Issue (4): 760-763.doi: 10.1016/S1004-4132(07)60012-7

• ELECTRONICS TECHNOLOGY • Previous Articles     Next Articles

Five modified boundary scan adaptive test generation algorithms

Niu Chunping, Ren Zheping & Yao Zongzhong
  

  1. The Academy of Armored Force Engineering, Beijing 100072, P.R. China
  • Online:2006-12-25 Published:2019-12-20

Abstract:

To study the diagnostic problem of Wire-OR (W-O) interconnect fault of PCB (Printed Circuit Board), five modified boundary scan adaptive algorithms for interconnect test are put forward. These algorithms apply Global-diagnosis sequence algorithm to replace the equal weight algorithm of primary test, and the test time is shortened without changing the fault diagnostic capability. The descriptions of five modified adaptive test algorithms are presented, and the capability comparison between the modified algorithm and the original algorithm is made to prove the validity of these algorithms.

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