
Journal of Systems Engineering and Electronics ›› 2025, Vol. 36 ›› Issue (4): 962-971.doi: 10.23919/JSEE.2025.000092
• SYSTEMS ENGINEERING • Previous Articles
Jiashuo ZHANG1(
), Derong CHEN1(
), Peng GAO1,*(
), Jin’gang ZHANG2(
), Yulong ZHANG3(
)
Received:2024-02-20
Online:2025-08-18
Published:2025-09-04
Contact:
Peng GAO
E-mail:18631209081@163.com;asd18832209082@163.com;gaopeng@bit.edu.cn;dsa18832209082@163.com;Mr.yulongzhang@foxmail.com
About author:Jiashuo ZHANG, Derong CHEN, Peng GAO, Jin’gang ZHANG, Yulong ZHANG. A dependency matrix processing algorithm to prioritize high incidence faults[J]. Journal of Systems Engineering and Electronics, 2025, 36(4): 962-971.
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Table 3
Experimental condition settings for constant N"
| Condition | Dimension | Density/% | N | Condition | Dimension | Density/% | N | |
| Condition 1 | 21×20 | 10 | 2 | Condition 7 | 61×60 | 10 | 2 | |
| Condition 2 | 21×20 | 10 | 3 | Condition 8 | 61×60 | 10 | 5 | |
| Condition 3 | 21×20 | 10 | 4 | Condition 9 | 61×60 | 10 | 8 | |
| Condition 4 | 21×20 | 60 | 2 | Condition 10 | 61×60 | 60 | 2 | |
| Condition 5 | 21×20 | 60 | 3 | Condition 11 | 61×60 | 60 | 5 | |
| Condition 6 | 21×20 | 60 | 4 | Condition 12 | 61×60 | 60 | 8 |
Table 4
Results of the expected test cost for PHAD, IG, and WFD (matrix size 21×20)"
| Density/% | Expected test cost | ||||||||
| N=3 | N is dynamic | ||||||||
| PHAD-IG | PHAD-WFD | IG | WFD | PHAD-IG | PHAD-WFD | IG | WFD | ||
| 10 | |||||||||
| 20 | |||||||||
| 30 | |||||||||
| 40 | |||||||||
| 50 | |||||||||
| 60 | |||||||||
| 70 | |||||||||
| 80 | |||||||||
| 90 | |||||||||
Table 5
Results of the expected test cost for PHAD, IG, and WFD (matrix size 61×60)"
| Density/% | Expected test cost | ||||||||
| N=8 | N is dynamic | ||||||||
| PHAD-IG | PHAD-WFD | IG | WFD | PHAD-IG | PHAD-WFD | IG | WFD | ||
| 10 | |||||||||
| 20 | |||||||||
| 30 | |||||||||
| 40 | |||||||||
| 50 | |||||||||
| 60 | |||||||||
| 70 | |||||||||
| 80 | |||||||||
| 90 | |||||||||
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