Journal of Systems Engineering and Electronics ›› 2024, Vol. 35 ›› Issue (4): 874-887.doi: 10.23919/JSEE.2023.000170
• DEFENCE ELECTRONICS TECHNOLOGY • Previous Articles
Received:
2023-01-11
Accepted:
2024-01-02
Online:
2024-08-18
Published:
2024-08-06
Contact:
Yong WANG
E-mail:caor@hit.edu.cn;wangyong6012@hit.edu.cn
About author:
Supported by:
Rui CAO, Yong WANG. Novel method for extraction of ship target with overlaps in SAR image via EM algorithm[J]. Journal of Systems Engineering and Electronics, 2024, 35(4): 874-887.
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Table 2
Parameters of EM algorithm and confidence ellipse for simulated data in the case of multiple IPPs"
Cluster | Eigenvalue | Axis length of ellipse | Eigenvector | |||||||
1 | 405.0 | 49.25 | 253.98 | |||||||
2 | 716.0 | 65.50 | 364.73 |
Table 3
Parameters of EM algorithm and confidence ellipse for simulated data in the case of multiple overlapping targets"
Cluster | Eigenvalue (×103) | Axis length of ellipse | Eigenvector | |||||||
1 | 1.02 | 2.91 | 78.15 | 132.04 | ||||||
2 | 0.81 | 6.83 | 69.45 | 202.34 |
Table 5
Parameters of EM algorithm and confidence ellipse for real measured data in the case of multiple IPPs"
Cluster | Eigenvalue (×103) | Axis length of ellipse | Eigenvector | |||||||
1 | 16.63 | 463.39 | 9.98 | 52.69 | ||||||
2 | 6.58 | 324.47 | 6.28 | 44.09 |
Table 6
Parameters of EM algorithm and confidence ellipse for real measured data in the case of multiple overlapping targets"
Cluster | Eigenvalue | Axis length of ellipse | Eigenvector | |||||||
1 | 21.09 | 219.78 | 11.24 | 36.29 | ||||||
2 | 52.74 | 323.70 | 17.78 | 44.04 |
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